Silicondash Features

fab data

Data Sources and Volume

Test data

Silicondash handles any volume of test data from any data source, equipment or supplier in any format.

  • Wafer test data
  • Final test data
  • Bin, parametric, and functional data
  • Fully compatible with ECID (Electronic chip ID) data

Wafer Fab data

  • WAT (PCM) data
  • Development of other types of fab data is well underway and integration of the following data types will be released in the summer of 2015
  • Wafer / Lot history data
  • Metrology data
  • Equipment data
data_quality

Data Quality

The Silicondash data integration platform enables product specific loading and storage recipes that guarantee 100% coherent stacking, merging, alignment and aggregation of data for every manufactured part.

sd users

Users

Silicondash user interface is designed to answer to the data analytics and reporting needs of entire operational organizations. Currently the system is used by executives, managers, product engineers, test engineers, quality engineers, sustaining engineers, device engineers, yield engineers and operators.
Depending of the infrastructure sizing, a single Silicondash instance can handle up to thousands of individual users simultaneously.

USE CASE

Analytic features

Silicondash is built to address engineering analysis and reporting needs in all phases of the product life-cycle: from early product characterization to early yield analysis to product yield ramp, to yield monitoring, sustaining and quality and yield management. It provides high-level production and engineering dashboards, as well as all the necessary visualization and drill-down capabilities for in-depth analysis to quickly identify issues and track down root causes.

SD EXPLORE

Interactive chart and table widgets

Silicondash contains a rich set of high-performance interactive charts and table widgets to visualize any kind of data. All charts include interactive features such as (auto)-zoom, select, highlight, and auto-drilldown on data points and data series. Underlying data structures and data paths from the database to the charts have been optimized so that any chart displays within less than 1.2 seconds, independent of the displayed data volume.

  • Wafer maps for bin, functional, parametric data.
  • Stacked wafer maps for up to thousands of wafers
  • Scrollable wafer galleries and wafer-flows® capable of displaying 1000’s of wafers
  • Trends, pareto plots, CDF plots, histograms, box-plots, scatter plots
  • Many types of interactive tables
  • and many more
 
SD EXPLORE

Exploration tree and reports

Identify issues and find root causes in a glance

Identifying issues and finding root causes with Silicondash is easy and can be done orders of magnitude faster than with any other tool because of the reports exploration tree.
Silicondash automatically generates and updates the reports tree containing millions of interlinked analysis reports that enable the user to look and browse through all possible data scopes from all possible angles. Every report addresses specific analysis use case and displays data at various data aggregation levels : part, wafer, sub-lot, lot, day, week, month, quarter, year, custom scope. Reports in the tree are interlinked and are accessible to the user within seconds, without performing any data queries or data manipulations.
For all new data coming in, Silicondash automatically prepares and updates the reports tree so that data is always fresh and up-to-date.

highlights

Automatically generated conclusions

Highlights are textual conclusions that Silicondash automatically generates and stores at data loading time. They help users to accelerate analysis by automatically detect and identify operational issues and providing instant drill downs to the analysis reports that help understand the root causes.

Highlights are automatically generated on wafer level and are then rolled-up to lot, day, week and month level for aggregated overviews.

Silicondash incorporates many different types of Highlights to automatically identify issues with test hardware, detect test limit sensitivities, yield shifts, quality issues, parametric drifts etc.

Qualtera data analysis specialists continuously develop and qualify new types of Highlight algorithms and make them available to Silicondash users.

dashboard

Custom dashboards

Get organized

Custom Dashboards provide fully user-customizable entry points to Silicondash. Users can define custom dashboard views that contain any collection of charts with their quick drill-downs to the underlying data. Dashboards can be easily edited, copied, saved and shared between users. Custom Dashboards are generated dynamically with up-to-date, fresh data  Some typical use cases for Custom Dashboards are:

  • Corporate traffic light dashboards
  • Supplier dashboards
  • Equipment dashboards
  • Technology dashboards
  • Single- or multiple product monitoring dashboards
  • Product centering dashboards
  • and many more
SD SCRIPTING

Automated analysis, algorithms, scripts, alerts and notifications

In Silicondash, users can design and automate repetitive and/or complex analyses with Scripts and Flows. Analysis Flows can be easily edited, saved, and shared between users for corporate deployment. 

Analysis Flows can be either run manually on selected data sets, or they can be put in production so that they get systematically triggered and executed every time new production data is loaded into the system. Flows can generate, store and communicate data and analysis results. Interoperability features and data channels enable adaptive test operations and sending out of alerts and emails.  

Typical use cases are for example: simulation of test limit changes, simulation of outlier detection algorithms, in-line quality outlier detection, adaptive test operations, SBL violations, alerts, and notifications.