Qualtera speaks at Global Semiconductor Forum, Shanghai 9th-11th March

The presentation will discuss the impact of the latest developments in big data analytics for semiconductor manufacturing and test environments. Examples and use cases of end-to-end big data platform will be presented in which real-time automated statistical methods and artificial intelligence are applied to live test data streams from end-to-end world-wide manufacturing and test chains. It will be shown how these sophisticated technologies are fundamentally changing the way executives and engineers approach operational practices and rapidly achieve gains in engineering efficiency, productivity, yield and device quality.