Qualtera at the International Test Conference 2016, Fort Worth, November 15-17

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Qualtera invites you to visit us at the International Test Conference 2016. We look forward to seeing you at the conference, the IEEE Data Workshop, and at booth #420 where will be providing demonstrations. You will be able to meet Qualtera experts, and learn about the most advanced on-line data collection engines that provide instant visibility on global test floor operations and real-time analytics for enhancing quality, yield and manufacturing control across the entire supply chain.